The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Jun. 28, 2022
Seiko Epson Corporation, Tokyo, JP;
Hikaru Kurasawa, Matsumoto, JP;
SEIKO EPSON CORPORATION, Tokyo, JP;
Abstract
A quality determination method includes: (a) generating a plurality of pieces of training data by classifying a plurality of pieces of non-defective product data into a plurality of classes; (b) executing learning of a machine learning model using the plurality of pieces of training data; (c) preparing a known feature spectrum group; and (d) executing quality determination processing of inspection data using the machine learning model and the known feature spectrum group. The (d) includes (d1) calculating a feature spectrum related to the inspection data, (d2) calculating a similarity between the feature spectrum and the known feature spectrum group, and (d3) determining the inspection data to be non-defective when the similarity is equal to or greater than a threshold value and determining the inspection data to be defective when the similarity is less than the threshold value.