The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
May. 19, 2021
Applicant:
Samsung Display Co., Ltd., Yongin-Si, KR;
Inventors:
Assignee:
SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2016.12); G06N 3/04 (2022.12); G06N 3/08 (2022.12); G06T 7/70 (2016.12);
U.S. Cl.
CPC ...
G06T 7/0004 (2012.12); G06N 3/04 (2012.12); G06N 3/08 (2012.12); G06T 7/70 (2016.12); G06T 2207/10061 (2012.12); G06T 2207/10116 (2012.12); G06T 2207/20081 (2012.12); G06T 2207/20084 (2012.12);
Abstract
A method of detecting a defect in a stacked structure of a display panel includes collecting a first image of the defect and a plurality of layers in the stacked structure from a database, learning a defect information of the defect and a layer information of the layers using a deep learning model based on the first image and detecting a location of the defect among the layers by the defect information and the layer information.