The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Jul. 14, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Ruriko Kawano, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/40 (2005.12); G06T 3/4007 (2023.12); H04N 1/387 (2005.12);
U.S. Cl.
CPC ...
G06T 11/40 (2012.12); G06T 3/4007 (2012.12); H04N 1/3875 (2012.12); G06T 2200/24 (2012.12);
Abstract

An information processing system is provided. A first generation unit generates a reduced image in which an original image is reduced. A display control unit causes a display unit of a predetermined apparatus to display the reduced image. A second generation unit generates, based on an input to the predetermined apparatus of a user, a mask image to be overlapped on the reduced image displayed on the display unit. An enlargement unit enlarges the mask image by using a different interpolation method in a case where the mask image has a predetermined property and in a case where the mask image does not have the predetermined property.


Find Patent Forward Citations

Kawano, Ruriko. (2025). Enlarging a mask image from a size corresponding to a reduced image using interpolation methods (U.S. Patent No. 12277631). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12277631

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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