The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Apr. 25, 2019
Applicant:
Deckard Technologies, Inc., La Jolla, CA (US);
Inventors:
Assignee:
Deckard Technologies, Inc., La Jolla, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 50/16 (2023.12); G06F 16/2458 (2018.12); G06F 16/29 (2018.12); G06F 40/268 (2019.12); G06F 40/279 (2019.12); G06F 40/30 (2019.12); G06N 5/048 (2022.12); G06N 20/00 (2018.12); G06Q 50/163 (2023.12); G06Q 50/26 (2023.12); H04L 67/10 (2021.12);
U.S. Cl.
CPC ...
G06Q 50/16 (2012.12); G06F 16/2465 (2018.12); G06F 16/29 (2018.12); G06F 40/30 (2019.12); G06N 5/048 (2012.12); G06N 20/00 (2018.12); G06Q 50/163 (2012.12); G06Q 50/26 (2012.12); G06F 40/268 (2019.12); G06F 40/279 (2019.12); G06F 2216/03 (2012.12); H04L 67/10 (2012.12);
Abstract
Described are medias, systems, and computer-implemented methods to detect improper residency status by performing a data mining task to data source to detect one or more improper residency indicia, applying a machine learning algorithm to identify an initial candidate, calculating a probability that the initial candidate has an improper residency status, and validating the detection. Further described are medias, systems, and computer-implemented methods to detect improper occupancy tax status.