The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Dec. 17, 2023
Applicant:

Soochow University, Suzhou, CN;

Inventors:

Zhe Li, Suzhou, CN;

Wei Deng, Suzhou, CN;

Assignee:

SOOCHOW UNIVERSITY, Suzhou, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2005.12); H04B 7/02 (2017.12); H04B 7/08 (2005.12);
U.S. Cl.
CPC ...
G06K 7/10366 (2012.12); H04B 7/028 (2012.12); H04B 7/0831 (2012.12);
Abstract

This application discloses a tag quantity estimation system and method of RFID. A processor-readable medium was disclosed at the same time. This estimation method applies a spatial diversity gain existing in a multi-antenna system. Separated and sequentially stacked the real parts and the imaginary parts of the multiple signals received by multiple antennas. Then, a tag quantity estimation problem is converted into a data clustering problem in high-dimensional space. In this way, the overlapped cluster data in low-dimensional space can be separated in the high-dimensional space, thereby improving the accuracy of tag quantity estimation.


Find Patent Forward Citations

Li, Zhe. (2025). Rfid tag quantity estimation system, rfid tag quantity estimation method (U.S. Patent No. 12277472). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12277472

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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