The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Jun. 22, 2022
Dell Products L.p., Hopkinton, MA (US);
Matthew Fredette, Belmont, MA (US);
Dell Products L.P., Hopkinton, MA (US);
Abstract
Processes include inertia bias values associated with migration paths and boundaries. When a process scheduler determines that a process is eligible for migration by comparing a process-related variable with a reference value, a new run domain is selected for the process and the inertia bias value specified by the process for the migration path is applied to the process-related variable to obtain a biased process-related variable. The process scheduler only migrates the process to the new run domain responsive to a determination that the process is still eligible for migration by comparing the biased process-related variable with the reference value. Thus, the process creator can specify process-specific tolerances for migration across NUMA boundaries via various paths.