The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Dec. 22, 2024
Applicant:

Innovation Academy for Precision Measurement Science and Technology, Cas, Wuhan, CN;

Inventors:

Songbai Kang, Wuhan, CN;

Linzhen Zhao, Wuhan, CN;

Dou Li, Wuhan, CN;

Kangqi Liu, Wuhan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G04F 5/14 (2005.12); H01S 3/00 (2005.12); H03L 7/26 (2005.12);
U.S. Cl.
CPC ...
G04F 5/14 (2012.12); H01S 3/0085 (2012.12); H03L 7/26 (2012.12);
Abstract

A method for compensating for frequency shifts caused by variation in an environmental parameter of an atomic clock is provided. A preset reference voltage of a proportional integral differential amplifier is set so that an offset frequency shift is generated in locking frequency of a laser. Then, the preset reference voltage is optimized by correcting the frequency shift coefficient to obtain an optimal reference voltage. A non-peak point of the resonance spectral line of the atomic clock is locked, so that the variation in the offset frequency shift caused by power variation of an optical signal output by the laser can compensate for the variation in the locking frequency of the laser caused by the power variation, thereby reducing the frequency shift coefficient caused by the power variation. The method is simple to operate and has universality.


Find Patent Forward Citations

Kang, Songbai. (2025). Method for compensating for frequency shifts caused by variations in environmental parameter of atomic clock (U.S. Patent No. 12276945). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12276945

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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