The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

May. 04, 2023
Applicant:

Asmedia Technology Inc., New Taipei, TW;

Inventor:

Te-Ming Kung, New Taipei, TW;

Assignee:

ASMedia Technology Inc., New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2005.12); G01R 31/317 (2005.12); G01R 31/3183 (2005.12);
U.S. Cl.
CPC ...
G01R 31/318572 (2012.12); G01R 31/31723 (2012.12); G01R 31/318371 (2012.12);
Abstract

A testing system and a testing method are provided. The testing system includes a first testing device and a second testing device. The first testing device is coupled to a first stream facing-port of a device under test (DUT). The first testing device includes a controller. The second testing device is coupled to a second stream facing-port of the DUT. The controller transmits a testing signal to the DUT through the first stream facing-port to test a universal serial bus (USB) of the DUT. The DUT is operated based on the testing signal to generate a data signal. The DUT outputs the data signal to the second testing device through the second stream facing-port. The second testing device obtains status information of the DUT which is operated based on the testing signal to generate a testing result. The controller determines whether the DUT is normal according to the testing result.


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