The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Mar. 09, 2021
Applicant:

Vuereal Inc., Waterloo, CA;

Inventors:

Gholamreza Chaji, Waterloo, CA;

Won Kyu Ha, Waterloo, CA;

Assignee:

VueReal Inc., Waterloo, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2005.12); G01R 1/067 (2005.12); G01R 31/265 (2005.12);
U.S. Cl.
CPC ...
G01R 1/07314 (2012.12); G01R 1/06794 (2012.12); G01R 31/265 (2012.12);
Abstract

The present disclosure describes a probe design to measure cycles of microdevices. In particular, the probe comprises, electrodes, dielectric, stimulating capacitor, voltage stimulating source for time varying stimulating voltage signal and a series switch to control biasing condition. The probe structure further has a probe tip and resting pads (ring shape or otherwise) along with a leveling mechanism and apparatus. The disclosure also describes a method to measure cycles of microdevices using the probe structure.


Find Patent Forward Citations

Chaji, Gholamreza. (2025). Coupling probe for micro device inspection (U.S. Patent No. 12276679). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12276679

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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