The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Jan. 13, 2025
Applicant:

Shenzhen University, Shenzhen, CN;

Inventors:

Jianbo Zhu, Shenzhen, CN;

Weiyue Bao, Shenzhen, CN;

Chengcheng Xie, Shenzhen, CN;

Tao Zhou, Shenzhen, CN;

Shiwei Zhang, Shenzhen, CN;

Zhuo Cen, Shenzhen, CN;

Yao Wang, Shenzhen, CN;

Junyan Li, Shenzhen, CN;

Assignee:

Shenzhen University, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/36 (2005.12); G01N 3/307 (2005.12);
U.S. Cl.
CPC ...
G01N 3/36 (2012.12); G01N 3/307 (2012.12); G01N 2203/0048 (2012.12); G01N 2203/0098 (2012.12); G01N 2203/0256 (2012.12);
Abstract

Provided is a stress blank angle eliminating device and method for a dynamic true triaxial electromagnetic Hopkinson bar. Objectives of eliminating influence of a stress blank angle in a sample in a test and preventing permanent deformation caused by mutual collision between the Hopkinson bars are achieved. The adjustable test device for eliminating the stress blank angle eliminates influence of the stress blank angle generated by the sample in a triaxial six-direction dynamic impact test process, and is convenient for obtaining real dynamic failure parameters of the sample.


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