The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Aug. 11, 2022
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Morad Behandish, San Mateo, CA (US);
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Abstract
A nondestructive method for detecting damage in parts and/or characterizing effective material properties may include: exposing a material to one or more nondestructive stimuli; measuring a response of the material to the stimuli; selecting at least one of a specific length scale or a specific time scale; and analyzing the measurement of the response with a scale-aware single- or multi-physics model to identify anomalies in the measurements as compared to an expected response of the material to the stimuli, wherein the scale-aware single- or multi-physics model is based on the at least one of the specific length scale or the specific time scale.