The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Oct. 19, 2021
Applicant:

Konica Minolta Inc., Tokyo, JP;

Inventors:

Tadashi Arimoto, Hino, JP;

Ikuma Ota, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/083 (2017.12); G01N 23/041 (2017.12); G01N 23/18 (2017.12); G01N 23/201 (2017.12); G06T 7/00 (2016.12);
U.S. Cl.
CPC ...
G01N 23/083 (2012.12); G01N 23/041 (2018.01); G01N 23/18 (2012.12); G01N 23/201 (2012.12); G06T 7/0004 (2012.12); G01N 2223/401 (2012.12); G06T 2207/10116 (2012.12); G06T 2207/30108 (2012.12);
Abstract

A state change tracking device includes: a hardware processor that non-destructively tracks a state change of an inspection target by a plurality of reconstructed images acquired by imaging the inspection target placed under a specific environment by an X-ray Talbot imaging device over time.


Find Patent Forward Citations

Arimoto, Tadashi. (2025). State change tracking device, x-ray imaging system, state change tracking method of inspection target, and life estimating method of inspection target (U.S. Patent No. 12276622). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12276622

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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