The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Aug. 17, 2023
Applicant:
Photothermal Spectroscopy Corp., Santa Barbara, CA (US);
Inventors:
Craig Prater, Santa Barbara, CA (US);
David Grigg, Santa Barbara, CA (US);
Derek Decker, Carmel, CA (US);
Assignee:
Photothermal Spectroscopy Corp., Santa Barbara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2005.12); G01N 21/35 (2013.12); G02B 21/00 (2005.12);
U.S. Cl.
CPC ...
G01N 21/35 (2012.12); G01J 3/45 (2012.12); G02B 21/002 (2012.12);
Abstract
Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.