The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Jan. 05, 2023
Applicant:

Wenzhou University, Zhejiang, CN;

Inventors:

Changkun Dong, Wenzhou, CN;

Ruizi Liu, Wenzhou, CN;

Jie Wang, Wenzhou, CN;

Assignee:

WENZHOU UNIVERSITY, Zhejiang, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/20 (2005.12); G01M 3/26 (2005.12); G01M 3/40 (2005.12);
U.S. Cl.
CPC ...
G01M 3/26 (2012.12);
Abstract

A vacuum-helium-leak-detection method based on a carbon-nanotube-based field-emission sensor that includes a carbon-nanotube-based cathode having a Raman amorphous peak I/graphite peak Iratio greater than 1.0. The method involves: setting a field-emission current at an initial, small emission current, recording an average of values of the field-emission current in a time period t, forming a sensing characteristic curve of the sensor, and performing fitting on the sensing characteristic curve so as to obtain an index curve; converting pressure values of helium gas into vacuum leak rates; and packaging the cathode into a vacuum chamber in a system to be detected, performing testing when a helium stream in the system to be detected reaches balance, obtaining an average of current variations in the time period t during the testing, and comparing the average with the index curve so as to determine a vacuum leak rate of the system to be detected.


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