The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Apr. 06, 2023
Applicant:

Cisco Technology, Inc., San Jose, CA (US);

Inventors:

Xunyuan Zhang, Mechanicsburg, PA (US);

Ravi S. Tummidi, Breinigsville, PA (US);

Tony P. Polous, San Jose, CA (US);

Mark A Webster, Bethlehem, PA (US);

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/12 (2005.12); G01M 11/00 (2005.12);
U.S. Cl.
CPC ...
G01M 11/30 (2012.12); G02B 6/12007 (2012.12); G02B 2006/12061 (2012.12); G02B 2006/12145 (2012.12); G02B 2006/12164 (2012.12);
Abstract

Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.


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