The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Jun. 28, 2022
Seiko Epson Corporation, Tokyo, JP;
Yoshihiro Kobayashi, Komagane, JP;
SEIKO EPSON CORPORATION, , JP;
Abstract
A measurement method includes: generating first measurement data based on observation data of an observation point of a structure; generating second measurement data by performing filter processing on the first measurement data; calculating a first deflection amount of the structure; calculating a second deflection amount by performing filter processing on the first deflection amount; approximating the second measurement data with a linear function of the second deflection amount to calculate a first-order coefficient and a zero-order coefficient; calculating a third deflection amount based on the first-order coefficient, the zero-order coefficient, and the second deflection amount; calculating an offset based on the zero-order coefficient, the second deflection amount, and the third deflection amount; and calculating a static response by adding the offset and a product of the first-order coefficient and the first deflection amount.