The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Jun. 01, 2021
Mettler-toledo (Changzhou) Precision Instruments Ltd, Changzhou, CN;
Mettler-toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Mettler-Toledo (Changzhou) Precision Instruments Ltd, Changzhou, CN;
Mettler Toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-Toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
A method and device are provided for diagnosing a weighing system. In the method, the weighing system acquires an intrinsic parameter, a status parameter, and an operating parameter of various components of the weighing system, environmental parameters of the weighing system application, and communication data and interaction data among all the components. A first-level prompt is sent when the status of any of the components is abnormal, such that the system stops operating. A second-level prompt is sent when the status of each of the components is normal and the service life status of at least one of the components reaches a preset threshold. A third-level prompt is sent when the status of each of the components is normal and a system performance abnormality event is identified for the performance status of the system. A fourth-level prompt is sent when the status of each of the components is normal.