The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Jul. 11, 2023
Applicant:

Skydio, Inc., San Mateo, CA (US);

Inventors:

Bernard J. Michini, San Francisco, CA (US);

Brett Michael Bethke, Millbrae, CA (US);

Hui Li, San Francisco, CA (US);

Assignee:

Skydio, Inc., San Mateo, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2005.12); G01C 11/02 (2005.12); G01C 15/02 (2005.12); B64U 101/30 (2022.12);
U.S. Cl.
CPC ...
G01C 15/02 (2012.12); G01C 11/02 (2012.12); B64U 2101/30 (2022.12);
Abstract

Aerial images captured by a first device are received. A landmark is identified in an aerial image of the aerial images. A determination is made, based on data in a data store, that the landmark is identified as a control point. Precise location information is associated with the control point in the data store. The precise location information indicates a location of a second device at a time that a third device that is different from the second device captured a prior image that includes the landmark. Imagery are generated using photogrammetry software based on the aerial image and the precise location information.


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