The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Apr. 27, 2020
Alpla Werke Alwin Lehner Gmbh & Co. KG, Hard, AT;
Christoph Nigl, Wolfurt, AT;
ALPLA Werke Alwin Lehner GmbH & Co. KG, Hard, AT;
Abstract
A method for operating a device to produce a product includes capturing at least one quality data record that includes measured values of one or more quality parameters that each correspond to one property of the product. The method captures at least one associated machine data record including actual values of several adjustable machine parameters of the device, chronologically assigns the quality data record to the machine data record, and generates a first data record comprising chronologically-correlated measured values and actual values. The preceding steps are repeated at least once to generate at least one second data record. A correlation is determined between the quality parameter(s) and the machine parameter(s). The method provides a corresponding target value for at least one of the adjustable machine parameters on the basis of the control model, proceeding from a target value of the quality parameter(s).