The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Dec. 22, 2022
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Keita Okutani, Kyoto, JP;

Hiroshi Okumura, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2023.12); A61B 6/12 (2005.12); A61B 6/42 (2023.12); A61B 6/46 (2023.12);
U.S. Cl.
CPC ...
A61B 6/541 (2012.12); A61B 6/12 (2012.12); A61B 6/42 (2012.12); A61B 6/463 (2012.12);
Abstract

An X-ray imaging apparatus is provided with an X-ray irradiation unit, a detector, an image generation unit, an optical imaging unit for capturing an optical image, a storage unit for storing a trained model, the trained model being configured to output determination information to an input image based on the optical image, the determination information determining a state regarding an imaging range of a predetermined site of the subject or a relative position of the predetermined site to the other site of the subject, a control unit for acquiring the determination information, using the trained model, and a notification unit.


Find Patent Forward Citations

Okutani, Keita. (2025). X-ray imaging apparatus (U.S. Patent No. 12274578). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12274578

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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