The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Mar. 25, 2019
Applicant:

Nidek Co., Ltd., Aichi, JP;

Inventors:

Tetsuyuki Miwa, Aichi, JP;

Kazunari Shimizu, Aichi, JP;

Shirohisa Kobayashi, Aichi, JP;

Tsutomu Uemura, Aichi, JP;

Kenji Nakamura, Aichi, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/16 (2005.12); A61B 5/00 (2005.12);
U.S. Cl.
CPC ...
A61B 3/165 (2012.12); A61B 2560/04 (2012.12);
Abstract

A non-contact ultrasonic tonometer for measuring the eye pressure of an examinee's eye by use of ultrasound includes a Langevin transducer. The Langevin transducer applies ultrasound to the examinee's eye to measure the eye pressure of the examinee's eye. Further, A non-contact ultrasonic tonometer for measuring the eye pressure of an examinee's eye by use of ultrasound includes: ultrasonic generating means for generating ultrasound; a support base supporting the ultrasonic generating means; and attaching means for attaching the ultrasonic generating means to the support base.


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