The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Nov. 30, 2021
Texas Instruments Incorporated, Dallas, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
Using a phase interferometry method which utilizes both amplitude and phase allows the determination and estimation of multipath signals. To determine the location of an object, a signal that contains sufficient information to allow determination of both amplitude and phase, like a packet that includes a sinewave portion, is provided from a master device. A slave device measures the phase and amplitude of the received packet and returns this information to the master device. The slave device returns a packet to the master that contains a similar sinewave portion to allow the master device to determine the phase and amplitude of the received signals. Based on the two sets of amplitude and phase of the RF signals, the master device utilizes a fast Fourier transform or techniques like multiple signal classification to determine the indicated distance for each path and thus more accurately determines a location of the slave device.