The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Jul. 05, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jaehun Jang, Suwon-si, KR;

Mankeun Seo, Suwon-si, KR;

Hongrak Son, Suwon-si, KR;

Bohwan Jun, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/37 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
H03M 13/3738 (2013.01); H03M 13/3715 (2013.01); G06F 11/1012 (2013.01); G06F 11/1044 (2013.01);
Abstract

An Error correction code (ECC) decoder including an input manager configured to sequentially receive a first read data including a plurality of data units read from a plurality of sectors in a memory cell array of a nonvolatile memory device, by unit of sector, a pre-decoder configured to sequentially receive the first read data and generate a respective syndrome of each of the data units, and a main decoder configured to sequentially perform a first ECC decoding on the first read data based on the respective syndrome. The input manager includes a defective sector buffer to store a data unit having a minimum expected error count from among data units on which a first ECC decoding is failed. The main decoder performs a second ECC decoding on a defective data unit stored in the defective sector buffer and receives a second read data from a selected sector corresponding to the defective data unit.


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