The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
May. 21, 2021
Applicant:
Kaneka Corporation, Osaka, JP;
Inventor:
Yoshiyuki Nasuno, Osaka, JP;
Assignee:
KANEKA CORPORATION, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02S 50/10 (2014.01); H02S 50/00 (2014.01);
U.S. Cl.
CPC ...
H02S 50/10 (2014.12); H02J 2300/22 (2020.01); H02S 50/00 (2013.01); Y02B 10/10 (2013.01); Y02E 10/50 (2013.01);
Abstract
An abnormality determination system includes a power generation amount measurement unit that measures a power generation amount of the photovoltaic facility; a data acquisition unit that acquires data of a solar radiation amount; a calculation unit that divides a summed value of the power generation amount per day by a summed value of the solar radiation amount per day to calculates a division value; and a data accumulation unit that accumulates a combination of the power generation amount and the solar radiation amount, or the division value, and is configured to determine that there is an abnormality based on a slope of the division values.