The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Oct. 22, 2021
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Tomohito Mizuno, Tokyo, JP;

Hideaki Fukuzawa, Tokyo, JP;

Tetsuya Shibata, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01F 10/32 (2006.01); G01R 33/09 (2006.01); G11B 5/39 (2006.01); H10N 50/10 (2023.01); H10N 50/85 (2023.01);
U.S. Cl.
CPC ...
H01F 10/3254 (2013.01); G01R 33/093 (2013.01); G01R 33/098 (2013.01); G11B 5/3903 (2013.01); H10N 50/85 (2023.02); H10N 50/10 (2023.02); Y10T 428/32 (2015.01);
Abstract

A photodetection element includes: a first ferromagnetic layer configured to be irradiated with light; a second ferromagnetic layer; and a spacer layer sandwiched between the first ferromagnetic layer and the second ferromagnetic layer, wherein the first ferromagnetic layer includes a first region in contact with the spacer layer and a second region disposed in a position farther from the space layer than the first region, the first region is made of CoFeB alloy, and the second region is a magnetic material containing Fe and Gd as major constituent elements.


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