The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Feb. 17, 2023
Applicant:

Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;

Inventors:

Christian Helmrich, Erlangen, DE;

Jérémie Lecomte, Fuerth, DE;

Goran Markovic, Nuremberg, DE;

Markus Schnell, Nuremberg, DE;

Bernd Edler, Fuerth, DE;

Stefan Reuschl, Nuremberg, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G10L 19/00 (2013.01); G10L 19/02 (2013.01); G10L 19/022 (2013.01); G10L 19/025 (2013.01); H04N 19/172 (2014.01); H04N 19/176 (2014.01); H04N 19/44 (2014.01);
U.S. Cl.
CPC ...
G10L 19/025 (2013.01); G10L 19/0212 (2013.01); G10L 19/022 (2013.01); H04N 19/172 (2014.11); H04N 19/176 (2014.11); H04N 19/44 (2014.11);
Abstract

An apparatus processing an encoded signal to acquire first and second frames comprising spectral values and an aliasing portion; applying a transform to the first frame using a first window function to acquire a first block of samples, applying another transform to a first portion of the second frame using a second window function, and applying another one or more transforms to a second portion of the second frame using one or more third window functions to acquire a second block of samples; and post-processing the second block of samples using a folding-out operation to acquire a post-processed second block of samples comprising a portion of the second block of samples overlapping with the first block of samples in a multi-overlap region, windowing the post-processed second block of samples using an auxiliary window function, and overlap-adding a windowed post-processed second block of samples and the first block of samples.


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