The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
May. 10, 2022
Ccc Intelligent Solutions Inc., Chicago, IL (US);
Steven Penny, Chicago, IL (US);
Mohan Liu, Chicago, IL (US);
Bahar Radfar, Seattle, WA (US);
Neda Hantehzadeh, Chicago, IL (US);
Bhadresh Dhanani, Chicago, IL (US);
Sagar Bachwani, Chicago, IL (US);
Ranjini Vaidyanathan, Chicago, IL (US);
Masatoshi Kato, Seattle, WA (US);
Srinivasan Krishnaswamy, Chicago, IL (US);
Mina Haratiannezhadi, Chicago, IL (US);
CCC INTELLIGENT SOLUTIONS INC., Chicago, IL (US);
Abstract
Methods, systems, and techniques for utilizing image processing systems to measure damage to vehicles include utilizing an image processing system to generate a heat map of an image of a damaged vehicle, where the heat map is indicative of a damaged area of the vehicle, and determining at least one measurement of the damaged area based on the heat map and a depth of field indicator corresponding to the image. In some embodiments, the image processing system also determines one or more types of damage of the damaged area, and/or also generates a segmentation map of the depicted vehicle and utilizes the segmentation map in conjunction with the heat map to measure damaged areas and locations thereof on the vehicle depicted within the image. In some embodiments, the techniques include determining the depth of field indicator of the image or portions thereof.