The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Apr. 13, 2022
Applicant:
Takahiro Koyama, Kanagawa, JP;
Inventor:
Takahiro Koyama, Kanagawa, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 7/00 (2017.01); G06V 10/44 (2022.01); G06V 10/74 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 7/001 (2013.01); G06V 10/44 (2022.01); G06V 10/761 (2022.01); G06V 10/7715 (2022.01); G06V 2201/07 (2022.01);
Abstract
An inspection apparatus includes processing circuitry. The processing circuitry acquires read image data obtained by reading an image printed on both sides of a conveyance medium. The processing circuitry searches for marks printed on both sides of the conveyance medium in the read image data. The processing circuitry outputs information indicating a misalignment amount of both sides of the conveyance medium based on positions where the marks are printed.