The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Sep. 15, 2021
Applicant:

Optum, Inc., Minnetonka, MN (US);

Inventors:

Thomas R. Gilbertson, Hartford, CT (US);

Raja Mukherji, Dublin, IE;

Haylea Tricia Northcott, Simsbury, CT (US);

Karen Harte, Avon, CT (US);

Colby A. Wright, Chandler, AZ (US);

Assignee:

Optum, Inc., Minnetonka, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 18/21 (2023.01); G06N 3/08 (2023.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G06F 18/217 (2023.01); G06N 3/08 (2013.01); G06T 7/11 (2017.01); G06T 2207/20132 (2013.01);
Abstract

Various embodiments of the present invention provide methods, apparatus, systems, computing devices, computing entities, and/or the like for production line conformance monitoring. For example, certain embodiments of the present invention utilize systems, methods, and computer program products that perform production line conformance monitoring by utilizing categorical validation machine learning models that are generated using a plurality of training production line images associated with a related category subset of a plurality of validation categories for a target validation category.


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