The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Jan. 31, 2024
Trieye Ltd., Tel Aviv, IL;
Elad Ayalon, Tel Aviv, IL;
Avraham Bakal, Tel Aviv, IL;
Uriel Levy, Tel Aviv, IL;
Omer Kapach, Tel Aviv, IL;
TriEye Ltd., Tel Aviv, IL;
Abstract
Described herein are systems and methods for on-the-fly detection of a defective pixel in an image that may include: receiving the image; for each analyzed pixel in the image, selecting an analyzed cell, wherein the analyzed cell includes a plurality of pixels; performing statistical distribution analysis for the plurality of pixels in the analyzed cell; determining an allowed statistical distance for the analyzed pixel relative to the analyzed cell; and determining that the analyzed pixel is a defective pixel if a computed statistical distance of the analyzed pixel exceeds the allowed statistical distance.