The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Aug. 10, 2022
Applicant:

Genentech, Inc., South San Francisco, CA (US);

Inventor:

Jasmine Patil, South San Francisco, CA (US);

Assignee:

GENENTECH, INC., South San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
Abstract

A data set can be provided that includes an input data element and one or more label data portion definitions that each identify a feature of interest within the input data element. A machine-learning model can generate model-identified portions definitions that identify predicted feature of interests within the input data element. At least one false negative (where a feature of interest is identified without a corresponding predicted feature of interest) and at least one false positive (where a predicted feature of interest is identified without a corresponding feature of interest) can be a identified. A class-disparate loss function can be provided that is configured to penalize false negatives more than at least some false positives. A loss can be calculated using the class-disparate loss function. A set of parameter values of the machine-learning model can be determined based on the loss.


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