The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Oct. 25, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Kazuhiko Isoyama, Tokyo, JP;

Yoshiaki Sakae, Tokyo, JP;

Jun Nishioka, Tokyo, JP;

Yuji Kobayashi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 2221/033 (2013.01);
Abstract

In order to provide an evaluation apparatus that appropriately evaluates a risk from continuous execution of an application without stopping execution of the application, an evaluation apparatus includes a first obtaining section, an evaluating section, and an output section. The first obtaining section is configured to obtain application information related to an application being executed on a server. The evaluating section is configured to evaluate a risk degree from continuous execution of the application on the server, based on the application information. The output section is configured to output an evaluation result of the risk degree.


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