The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Nov. 17, 2020
Applicant:

Hitachi Vantara Llc, Santa Clara, CA (US);

Inventors:

Leon Burda, Cupertino, CA (US);

Lingling Yan, Morgan Hill, CA (US);

Shayak Sadhu, Hooghly, IN;

Assignee:

HITACHI VANTARA LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/906 (2019.01); G06F 16/907 (2019.01);
U.S. Cl.
CPC ...
G06F 16/906 (2019.01); G06F 16/907 (2019.01);
Abstract

In some examples, a system receives a user input to create a classification to use for a first data set. In addition, the system may receive a user input to associate the classification with the first data set as reference data. The system may determine a classification association with the first data set based in part on comparing a first classification model corresponding to the reference data with a second classification model of a second data set, the second classification model being determined based at least in part on a plurality of data properties of the second data set. Further, the system may determine a user curation result with respect to the classification association with the first data set, and may update the classification model for the first data set based at least in part on the user curation result.


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