The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Apr. 20, 2022
Oracle International Corporation, Redwood Shores, CA (US);
Raghu Hanumanth Reddy Patti, San Bruno, CA (US);
Christopher A. Roy, Amherst, NH (US);
Ana Maria Hernandez McCollum, Belmont, CA (US);
Manas Goswami, San Ramon, CA (US);
Janet Kay Kolko, Golden, CO (US);
Sreenivas Reddy, San Ramon, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques for selecting a runbook to recommend for remediating a detected event are disclosed. When a system detects an event, the system obtains metadata associated with the event. The metadata provides information about the event and a system topology of the system in which the event occurred. The system generates a recommendation for a runbook to remediate the event based on one or both of characteristics of the event and characteristics of the topology in which the event occurred. The system compares a system topology to system topologies associated with previously-executed runbooks. The system recommends one of the previously-executed runbooks to remediate a detected event based on determining that the topology associated with the previously-executed runbook is similar to the topology of the system in which the event occurred.