The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Apr. 16, 2024
Applicant:

Cerner Innovation, Inc., Kansas City, MO (US);

Inventors:

Ranjeet Joseph Kumar Anthonappa, Bengaluru, IN;

Venkata Nageswara Rao Desaraju, Bangalore, IN;

Sneha Raveendran, Bengaluru, IN;

Sudarshan Babu Kotapati, Bengaluru, IN;

Assignee:

Cerner Innovation, Inc., Kansas City, MO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/22 (2006.01); G06F 11/263 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/2273 (2013.01); G06F 11/263 (2013.01); G06N 20/00 (2019.01);
Abstract

Methods, systems, and computer-readable media are disclosed herein combine randomization functionalities with the machine-learning prioritization of workflows for performance testing. In aspects, a primary workflow having a sequence of user interface steps is input. Testing workflows are generated that represent each variable position of unlocked steps in the sequence of the primary workflow while maintaining the sequential position of any locked steps. These testing workflows are then ingested to a machine learning model that identifies as subset of the testing workflows to prioritize over other. Specifically, testing workflows are prioritized that at least partially match sequence patterns in historical workflow data that is associated with vulnerable computer code. The subset is output and tested by testing engine to generate a report of any vulnerable computer code.


Find Patent Forward Citations

Loading…