The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Dec. 22, 2022
Applicant:

Suzhou Metabrain Intelligent Technology Co., Ltd., Jiangsu, CN;

Inventors:

Siheng Luo, Jiangsu, CN;

Cai Kong, Jiangsu, CN;

Yang Yang, Jiangsu, CN;

Zhanliang Chen, Jiangsu, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01);
Abstract

A device fault diagnosis system includes: a data sampling chip, a first memory, and a processor, wherein the data sampling chip includes a plurality of data collection channels; the data sampling chip collects working data of monitoring positions electrically connected to respective data collection channels, in a device to be monitored, through the respective data collection channels; when determining that the working data of a first monitoring position is abnormal, generates an interrupt signal corresponding to the first monitoring position; and transmits the interrupt signal to the first memory; the first memory stores the working data of the first monitoring position within a preset time period starting from a moment when the interrupt signal is received, into a preset position; and the processor periodically polls the data sampling chip, and after determining that the data sampling chip generates the interrupt signal, reads the working data from the preset position.


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