The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Nov. 29, 2019
LA Trobe University, Melbourne, AU;
Brian Abbey, Melbourne, AU;
Eugeniu Balaur, Melbourne, AU;
LA TROBE UNIVERSITY, Melbourne, AU;
Abstract
A method of analysis of a sample is described. The method includes providing a sample holder having an upper surface and a lower surface, the upper surface having a plasmonic layer associated therewith, the plasmonic layer including a periodic array of sub-micron structures. A sample is applied to the sample holder and illuminated. At least one localised structural property of the sample is visible in an image formed based on the colour of the received light. The method includes using the image formed to control a subsequent analysis process. The subsequent analysis process can be another microscopy process such as TEM, SEM or the like.