The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Nov. 07, 2022
Nextnav, Llc, Sunnyvale, CA (US);
Michael Dormody, San Jose, CA (US);
Guiyuan Han, San Jose, CA (US);
Badrinath Nagarajan, Cupertino, CA (US);
Wei Liu, San Jose, CA (US);
Prashant Dave, Rajasthan, IN;
Arun Raghupathy, Bangalore, IN;
NextNav, LLC, Sunnyvale, CA (US);
Abstract
Field calibration of a pressure device involves collecting simultaneous pressure data or pressure and temperature data at two devices for multiple time points. Pressure differences between pairs of simultaneous data points of the collected pressure data are calculated. A model is fitted to the pressure differences and the temperatures and/or pressures, and model parameters are used to correct measurements from the second device. Alternatively, a pressure gradient is estimated for a region that encompasses the two devices for each time point. A distance is determined between the two devices. A pressure gradient difference is determined between the two devices for each time point. A pressure difference offset is obtained for one of the pairs of simultaneous data points for each time point. An average pressure difference offset is determined between the two devices and is used to correct measurements from one of the devices.