The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Nov. 08, 2023
Applicant:

Landor Architecture, Inc., Seoul, KR;

Inventors:

Han Seok Nam, Seoul, KR;

James Patten, Brooklyn, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 5/08 (2006.01); G01S 5/02 (2010.01); G01S 5/14 (2006.01);
U.S. Cl.
CPC ...
G01S 5/08 (2013.01); G01S 5/021 (2013.01); G01S 5/14 (2013.01);
Abstract

This application relates to a location measuring system including a driving-type working device. In one aspect, the system includes a data receiving unit that receives marking data about a working surface, a marking unit that executes a marking operation with respect to the working surface corresponding to the marking data, and a scanning unit that scans a target space. The system may also include a scan condition setting unit that sets a movement path of the driving-type working device corresponding to the marking data, sets a scanning position for scanning the target space in consideration of space map data corresponding to the target space, and sets a scan angle of the scanning unit at the scanning position. The system may further include a position detecting unit that compares scan data acquired via the scanning unit with the space map data to detect a position of the driving-type working device.


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