The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Oct. 09, 2023
Applicant:

Beijing Tusen Zhitu Technology Co., Ltd., Beijing, CN;

Inventors:

Jian Lu, Beijing, CN;

Pingyuan Ji, Beijing, CN;

Haiquan Li, Beijing, CN;

Jianan Hao, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/50 (2006.01); G01S 17/88 (2006.01); H04N 23/54 (2023.01);
U.S. Cl.
CPC ...
G01S 17/50 (2013.01); G01S 17/88 (2013.01); H04N 23/54 (2023.01);
Abstract

The present disclosure relates to sensor technology, and provides a method, an apparatus, and a system for vibration measurement for a sensor bracket as well as a movable device. The method is applied in a system for vibration measurement for the sensor bracket. The system includes the sensor bracket to be measured that is mounted on a movable device, and a marker on the sensor bracket to be measured, and a first sensor provided on the sensor bracket to be measured for collecting marker information. The method includes: collecting the marker information of the marker on the sensor bracket to be measured using the first sensor; determining a vibration measurement reference point based on the marker information, and obtaining vibration condition data of the vibration measurement reference point; and determining a vibration evaluation result for the sensor bracket based on the vibration condition data of the vibration measurement reference point.


Find Patent Forward Citations

Loading…