The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Jun. 08, 2021
Applicant:

Raytheon Company, Arlington, VA (US);

Inventors:

Raymond Samaniego, Prosper, TX (US);

Aaron C. Wallace, Fairview, TX (US);

Assignee:

Raytheon Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9019 (2019.05);
Abstract

A multi-hypothesis spatially-variant autofocus system for processing and focusing radar images, such as synthetic aperture radar (SAR) imagery, is configured to compute phase corrections and apply multiple autofocus strategies to overlapping image tiles for progressively smaller image tile sizes. Correction factors for the image tiles may be selected on a per-tile basis based on various metrics. In some embodiments, one or more phase-gradient autofocus (PGA) algorithms may be applied to window-size weighted versions of the overlapping image tiles for the progressively smaller image tile sizes.


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