The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

May. 16, 2024
Applicant:

Trustees of Boston University, Boston, MA (US);

Inventors:

Joshua Javor, Cambridge, MA (US);

David Bishop, Brookline, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01); G01R 33/00 (2006.01); G01R 33/022 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0206 (2013.01); G01R 33/0082 (2013.01); G01R 33/022 (2013.01);
Abstract

A system and method of measuring a magnetic field from a source. A plurality of sensors each include a plurality of sensing elements. A first sensing element is configured to detect an intensity of the magnetic field and a second sensing element is configured to directly measure a gradient of the magnetic field. A positioned is determined, with respect to the source, where a magnitude of the magnetic field in a first direction is greatest. An orientation of the sensors is determined in a three-dimensional pattern by arranging the sensors to emphasize sensing the magnetic field in the first direction. The sensors are oriented and positioned according to the position and orientation determined. The magnetic field is measured, in the first direction, using the sensors.


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