The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Sep. 19, 2019
Microhortone Llc, Central, SC (US);
Pingshan Wang, Central, SC (US);
Abstract
A methodology for measuring the dielectric and magnetic properties of materials is provided. The method comprises a multi-section transmission line (TL) and multi-section fluidic channels. Two of the TL sections are incorporated with channel sections. The length-ratio of the two line-channel sections (LCS) is L':L″. A network analyzer coupled to the TL can be configured to measure scattering parameters when the LCS have no material-under-measurement (MUM), one LCS has MUM, both LCSs have MUM. Then, the S-parameters are transformed to ABCD matrices. When L′:L″ is 2:1, the propagation constant of the LCSs can be calculated with analytical formulas over the measured frequency range. When L′:L″ is not 2:1, the propagation constant can be obtained with numerical root-searching algorithms. The properties of MUM can be extracted by use of models which relate the propagation constants with the given geometry and substrate of LCSs as well as the unknown MUM properties.