The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Aug. 26, 2019
Hitachi High-tech Corporation, Tokyo, JP;
Daisuke Ebihara, Tokyo, JP;
Shinya Matsuoka, Tokyo, JP;
Makoto Nogami, Tokyo, JP;
Taku Sakazume, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
Provided is an automatic analysis device and an analysis method which are capable of reliably detecting an abnormality in a dispensing amount of a solution such as a specimen or a reagent to be dispensed and suppressing a decrease in analysis accuracy. Included are a specimen dispensing mechanismthat dispenses an analysis target specimen in a reaction vessel, a reagent dispensing mechanismthat dispenses another dispensing object different from the specimen in the reaction vessel, and a mass analyzing unitthat detects and analyzes a specific component in a reaction solution in which a specimen dispensed into the reaction vesseland another dispensing object are mixed to each other, in which it is determined whether a dispensed liquid amount of the another dispensing object is abnormal or not, based on a detection result of a standard substance for dispensing inspection which has been added in advance to the another dispensing object, which is detected at the same time with the detection of the analysis target component of the specimen in the reaction solution in the mass analyzing unit