The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Jul. 28, 2022
Applicant:

Qsa Global Inc., Burlington, MA (US);

Inventors:

Paul Benson, Waltham, MA (US);

Jason William Bourn, Stratham, NH (US);

Assignee:

QSA Global Inc., Burlington, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/18 (2018.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01);
U.S. Cl.
CPC ...
G01N 23/18 (2013.01); G01N 23/04 (2013.01); G01N 23/083 (2013.01); G01N 2223/401 (2013.01);
Abstract

An example portable radiography scanning system includes: a radiation detector configured to generate a digital image based on incident radiation; a radiation emitter configured to output the radiation; a frame configured to hold the radiation emitter and/or the detector such that the emitter directs the radiation to the detector; a first sensor configured to determine a first distance between the detector and emitter; and a computing device configured to: determine a second distance between the emitter and an interface between the radiation and the object; determine a magnification correction factor based on the first and second distances; measure a size, in pixels, of a feature of the object in the image; and: calculate an actual size of the feature based on the magnification correction factor and the measured size, and/or determine whether the measured size of the feature satisfies a threshold size based on the magnification correction factor.


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