The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Nov. 26, 2021
Applicant:

Endress+hauser Flowtec Ag, Reinach, CH;

Inventors:

Anne Habermehl, Erding, DE;

Stefan Pflüger, Munich, DE;

Wolfgang Drahm, Freising, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 22/00 (2006.01); G01F 1/58 (2006.01); G01F 1/74 (2006.01);
U.S. Cl.
CPC ...
G01N 22/00 (2013.01); G01F 1/74 (2013.01); G01F 1/58 (2013.01);
Abstract

A method for determining a deposit property of a variable deposit on an end face of a first microwave antenna of an assembly for determining a property of a multiphase medium that is to be conveyed, wherein the first microwave antenna is arranged in a first receptacle of the measuring pipe in a medium-contacting manner, wherein the method comprises emitting an excitation signal by means of the first microwave antenna, wherein the excitation signal comprises a sequence of high-frequency signals; receiving a reflected excitation signal by means of the first microwave antenna; determining a first test quantity on the basis of the reflected excitation signal; and determining on the basis of the first test quantity the deposit property of the variable deposit, in particular a variable dependent on a deposit thickness of the variable deposit.


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