The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Jun. 19, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Akira Tsuji, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01B 11/00 (2006.01); G01B 11/02 (2006.01); G01C 15/00 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8803 (2013.01); G01B 11/02 (2013.01); G01C 15/00 (2013.01); G01B 11/00 (2013.01); G01N 2021/8887 (2013.01); G01N 21/95 (2013.01);
Abstract

An inspection support apparatus () includes: an acquisition unit () configured to acquire information about specifications of a three-dimensional sensor, information about a shape and a planned placement position of each member to be inspected, and information about a planned installation position of the three-dimensional sensor; a simulation unit () configured to: calculate a distance between the planned placement position of each member and the planned installation position of the three-dimensional sensor based on the information acquired by the acquisition unit (); generate virtual point group data, a plurality of times for each calculated distance and for each member; and obtains a range of variations of variances in a predetermined direction based on the virtual point group data, and a determination unit () configured to determine whether or not each member can be distinguished at the planned placement position thereof based on the above-described range of variations.


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