The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Aug. 23, 2022
University of Rochester, Rochester, NY (US);
Arturo Alejandro Canales Benavides, Rochester, NY (US);
Paul Scott Carney, Washington, DC (US);
James Matthew Zavislan, Canaandaigua, NY (US);
Abstract
A scanning imaging method includes splitting an optical beam into a reference beam and a scanning beam, generating an interference map, and processing the interference map to produce a reconstructed image of a sample. Generating the interference map includes, for each of a plurality of sections of the sample, generating a respective interference-map element of the interference map by: (i) illuminating the section with the scanning beam to generate a plurality of scattered beams, each scattered beam corresponding to a respective spatial frequency of the scanning beam, (ii) attenuating the reference beam, (iii) generating a plurality of interference signals at least in part by interferometrically combining the plurality of scattered beams and the attenuated reference beam while modulating a phase difference between the reference beam and the plurality of scattered beams, and (iv) detecting the plurality of interference signals to yield the respective interference-map element.