The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Nov. 06, 2024
Applicant:

Guangdong University of Technology, Guangdong, CN;

Inventors:

Shengli Xie, Guangdong, CN;

Bo Dong, Guangdong, CN;

Rui Wu, Guangdong, CN;

Zihao Ni, Guangdong, CN;

Yulei Bai, Guangdong, CN;

Victor Fedorovich Kuzin, Guangdong, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
G01B 11/161 (2013.01);
Abstract

Disclosed is a strain calculation method and system for phase-sensitive optical coherence elastography (PhS-OCE), including the following steps: obtaining interference spectra for various states during sample deformation, and extracting spectral information including multiple amplitude maps and multiple phase maps from these interference spectra. In the present disclosure, the speckle decorrelation phenomenon in PhS-OCE can be eliminated, the measurement range is expanded, and tangential displacement fields and strain fields can be measured by PhS-OCE technique while ensuring high axial sensitivity in strain measurement.


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