The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Sep. 28, 2020
Applicant:
Nec Corporation, Tokyo, JP;
Inventor:
Jiro Abe, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 11/03 (2006.01);
U.S. Cl.
CPC ...
G01B 11/002 (2013.01); G01B 11/03 (2013.01);
Abstract
A measurement device acquires first point cloud data at a first measurement position and second point cloud data at a second measurement position; determines a rotation axis for positional adjustment; determines, based on the rotation axis, the first point cloud data, and the second point cloud data, an evaluation function indicating a region that is a union set of one or more columnar bodies as an evaluation function representing desirability of a positional adjustment result; and calculates a positional adjustment parameter that optimizes the evaluation function based on the rotation axis, the first point cloud data, and the second point cloud data.